New AI Technique Dramatically Speeds up Microscopy by Selectively Scanning Key Points

Scientists have developed an AI-powered autonomous microscopy technique that selectively scans points of interest instead of everything.

The AI algorithm initiates scanning at random points, gathering data while predicting subsequent points of interest.

This speeds up data acquisition dramatically by eliminating the need for human intervention.

The technique can be used with various microscopes like X-ray, electron, and atomic probe.

It opens new possibilities for exploring materials science by rapidly extracting key information.